//**************************************************************************************
//MEMC.TST
//By B. Rosen and M. Thomson  						January 28, 1982  //Main Test Program for UTFP Controller Module
//**************************************************************************************

//NOTES: 1) This test is for rev. M S/W or Etch #1 boards and rev. B Etch #2 boards.
//          (See MEMA.TST for prom revisions.)
//          (If prom i7(u52/u34) is not rev. E Test 2 will fail)

//       2) Run the MEMB test first
//       3) Remove test cable #5 from socket "E" to b9(u54/u135), i2(u45/u10), and f14(u94/u60)
//       4) Transfer the test clip from location g2(u32/u42) to location b5(u40/u45)
//       5) Transfer the test clip from location b3(u26/u30) to location i4(u51/u51)
//          (note: i4(u51/u51) is a 14-pin dip while the clip is a 16-pin clip,
//          therefore, make sure pin 1 of the clip is on pin 1 of the dip)
//       6) Clip the dangling test clip to location b9(u54/u135)
//       7) Install test cable #6 from socket "E" to the locations listed below 
//       8) Ground pin 14 of location i7(u52/u34) 
//       9) Insert special test platform in location I- 1.  See sil drawing
//          on Indigo<D0>MemcI-1Plat
// 	           

//**************************************************************************************

//DUMP FILES in ifs-2 under <Thomson>:

//See MEMA.TST. The dump files listed contain MEMA, MEMB, and MEMC tests

//**************************************************************************************

//INSTALL THE FOLLOWING TEST CONNECTORS:

//CABLE #1: Tester socket "B" to the following
//	20-pin clip to c4 (u41/u46)
//		DisableMC1: c4.1,1
//		R_Pipe': c4.2,2
//		MC1Pipe.1: c4.5,3
//		MC1Pipe.2: c4.6,4
//		MC1Pipe.3: c4.9,5
//		LoadPipe: c4.12,6
//		MC1Ref': c4.15,7
//		MC1Store': c4.16,8
//	14-pin clip to e9 (u98/u100)
//		MC2SetFault: e9.5,9
//		LDisableMC1': e9.13,10
//	16-pin clip to h2 (u46/u26)
//		Disableh2: h2.14,11
//		ChkPhase0': h2.12,12
//	20-pin clip to e2 (u35/u70)
//		Disablee2: e2.1,13
//		Odata_Cdat': e2.9,14
//		R_H3U': e2.15,15
//		R_H3C': e2.16,16

//CABLE #2: Tester socket "C" to the following
//	20-pin clip to g14 (u112/u140)
//		R_H3I': g14.1,1
//	16-pin clip to i4
//		i4pin3: i4.3,2 (u51/u51)
//		StorAccessType: i4.2,3
//	20-pin clip to b6 (u29/u47)
//		preMC1Next.6: b6.6,4
//		preMC1Next.7: b6.9,5
//		MC1TestH4Par: b6.12,6
//		MC1TestFault: b6.15,7
//		MC1SetFault: b6.16,8
//		PreloadMC1': b6.19,9
//	20-pin clip to h3 (u30/u73)
//		DisableMC2: h3.1,10
//		LoadSyndrome: h3.5,11
//		preLoadOdata': h3.6,12
//		MC2Hold': h3.12,13
//		MC2WriteCdat: h3.15,14
//		MC2NeedsR': h3.16,15
//		MC2NeedsRIfSNE0: h3.19,16

//CABLE #3: Tester socket "D" to the following
//	20-pin clip to b5 (u40/u45)
//		GenPhase0: b5.2,1
//		IMux_Cdat: b5.5,2
//		H4_IMux: b5.6,3
//		MapRAS': b5.9,4
//		MapCAS': b5.12,5
//		MapWrite': b5.15,6
//	16-pin clip to c2 (u10/u13)
//		MC1Next.7': c2.15,7
//	20-pin clip to d4 (u42/u48)
//		MC1SXport: d4.5,8
//		MC1WriteMem: d4.12,9
//		MC1StartMC2: d4.15,10
//		MC1ClkOutput: d4.16,11
//		PreRowAd': d4.19,12
//	20-pin clip to b9 (u54/u135)
//		Disableb9: b9.1,13
//		EnInputParChk: b9.19,14
//		MC1Pipe.0: b9.9,15
//		PStore12': b9.16,16

//CABLE #6: Tester socket "E" to the following
//	16-pin clip to c9 (u70/u37)
//		LogSngErr: c9.3,1
//		WriteProtect: c9.6,2
//		Dirty: c9.10,3
//		Referenced: c9.13,4
//	16-pin clip to c10 (u84/u52)
//		Map.04: c10.3,5
//		Map.05: c10.6,6
//		Map.06: c10.10,7
//		Map.07: c10.13,8
//	14-pin clip to h15 (u75/u77)
//		Map.08: h15.12,9
//	20-pin clip to a17 (u58/u125)
//		Map.09: a17.11,10
//		Map.10: a17.17,11
//		Map.11: a17.6,12
//		Map.12: a17.4,13
//		Map.13: a17.13,14
//		Map.14: a17.2,15
//		Map.15: a17.15,16

//**************************************************************************************
get "memc.d"

static
[
	pass = 0
	otime = 0
	exectime = 0
]

//Edge pin and test connector signal busses available to this sub-test:

//{Idata: Idata.00,  Idata.01,Idata.02,Idata.03,  Idata.04,Idata.05,Idata.06,  Idata.07,Idata.08,Idata.09,  Idata.10,Idata.11,Idata.12,  Idata.13,Idata.14,Idata.15}

//{rbus: R.00,  R.01,R.02,R.03,  R.04,R.05,R.06,  R.07,R.08,R.09,  R.10,R.11,R.12,  R.13,R.14,R.15}

//{StorDin: StorDin.00,  StorDin.01,StorDin.02,StorDin.03,  StorDin.04,StorDin.05,StorDin.06,  StorDin.07,StorDin.08,StorDin.09,  StorDin.10,StorDin.11,StorDin.12,  StorDin.13,StorDin.14,StorDin.15}

//**************************************************************************************
//main program for MEMA module test

let main() be
[
	pass = pass+1

	Test1()
	Test2()
	Test3()
	Test4()

]  repeat

//**************************************************************************************
//Routines available for MEMC module tests

//Wait-Comparison routine
and WCompare(was,sb,testno,drive; numargs na) be
[
	if was eq sb then return

	Ws(FORMATN("*nTest <D>: Was = <B>, Should be = <B>",testno,was,sb))
	if na gr 3 then Ws(FORMATN(", drive = <B>",drive))

	while Endofs(keys) do [  ]  
	Gets(keys)
	Ws("*nRunning...")
]

//**************************************************************************************
//Clocking routines defined on page 14

and EClock() be  //EdgeClockFeed' is normally high
[
	{EdgeClockFeed'}=0
	{EdgeClockFeed'}=1
]

and RClock() be  //RamClockFeed' is normally high
[
	{RamClockFeed'}=0
	{RamClockFeed'}=1
]

//**************************************************************************************
and SpeakTest(testno) be
[

//Calculate the execution time for each test
	let tv=vec 2
	Timer(tv)
	exectime = tv!1 - otime
	otime = tv!1
	Ws(FORMATN("*nExection Time for this test is <D> msec.",exectime))

//Set up title display
	Ws("*n")
	Ws("*n")
	Ws(FORMATN("*nMEMC TEST (rev. M): Pass <D>, Test <D>...",pass,testno))

//SET UP MISCELLANEOUS INITIAL CONDITIONS:

//Disconnect tester output drivers from the R bus:
	{rbus}=###

//Disconnect tester output drivers from various tri-state sources:
//{membus1: EnInputParChk,MC1Pipe.0,  Odata_Cdat',PStore12',Refresh',  R_H3C',R_H3U',StorA0,  StorA1,StorA2,StorA3,  StorA4,StorA5,StorA6}
	{membus1}=###

//Enable tri-state sources b9,e2, and disable souces h2,MC1,MC2:
//{membus2: Disableb9,Disablee2,  Disableh2,DisableMC1,DisableMC2}
	{membus2}=7

//Clear existing busses in general use:
	{Idata}=0
	{StorDin}=0

//Clear combined edge-pin input busses:
//{membus3: ALUF.0,  ALUF.1,ALUF.2,ALUF.3,  CTask.0,CTask.1,CTask.2,  CTask.3,StorEcIn.0,StorEcIn.1,  StorEcIn.2,StorEcIn.3,StorEcIn.4,  StorEcIn.5,StorEcIn.6,StorEcIn.7}
	{membus3}=#170000

//Set up individual edge-pin inputs:
//{membus4: Cycle0Feed',  MC1XferWord,MC2XferWord,MemInst-a,  MOBounds,PAbort,QWO,  RamClockFeed',ReadSyn',ResetMemErrs'}
	{membus4}=#107

//Tester-controllable signals to be set to 1 (from disabled tri-state sources):
//{membus5: H4_IMux,  LoadSyndrome,MapCAS',MapRAS',  MapWrite',MC1Ref',MC1StartMC2,  MC1Store',MC2Hold',MC2NeedsR',  PreRowAd',R_H3I',R_Pipe'}
	{membus5}=#177777

//Tester-controllable signals to be set to 0 (from disabled tri-state sources):
//{membus6: ChkPhase0',  IMux_Cdat,MC1TestH4Par,MC2HoldIfSNE0,  MC2NeedsRIfSNE0,PreloadMC1',preLoadOdata'}
	{membus6}=0

//Generate 8 EClocks to flush the system and initialize EdgeClockFeed'=1:
//{Clock: EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed'}
	{Clock}=#125252
]

//NOTES: The action above results in the following secondary effects

//Partial list of gate outputs:
//	AdvancePipe' =0 (page 18)
//	ChkSyn[0:7] =0 (pages 2,6)
//	CorrectThisWord' =1 (page 3)
//	H4SelIMux =1 (page 18)
//	LDisableMC1' =1 (page 18)
//	LoadAd' =0 (page 18)
//	LoadType' =0 (page 18)
//	MC2DisableMC1' =1 (page 18)
//	MC2DisableMC1t' =1 (page 18)
//	MC2NotReady =0 (page 18)
//	MC2SynReady =1 (page 18)
//	MC2WillGetR =0 (page 20)
//	SNE0 =0 (page 18)

//Partial list of flip-flops:
//	CrctSyn[0:7] _(ChkSyn[0:7] =0) (page 19)
//	CW2'_CW1'_CW0' _(ChkPhase0' =0) (page 6)
//	EnColAd' _(EnRowAd' =1) (page 13)
//	EnRowAd' _(PreRowAd' =1) (page 13)
//	GateALUParity _0 since Odata_Cdat' =0 (page 10)
//	h14c_h14b_h14i_h14h _(LoadSyndrome =1) (page 3)
//	i16 ff's,,b15 ff's _(StorEcIn[0:7] =0) (pages 2,6)
//	MC2HasR' _1 since MC2WillGetR =0 (page 18)
//	MC2XferingWord' _1 since MC2XferWord =0 (page 18)
//	Odata_Cdat' _0 since preLoadOdata' =0 (page 20)
//	R_H3C' _1 since MC2XferWord =0 (page 20)
//	R_H3U' _1 since MC2XferWord =0 (page 20)
//	TypeLoaded' _0 since LoadType' =0 (page 18)
//	Udat[0:15] _(StorDin[0:15] =0) (pages 4,5)