//************************************************************************************** //MEMB.TST //By B. Rosen and M. Thomson April 24, 1979 //Main Test Program for UTFP Controller Module //************************************************************************************** //NOTES: 1) This test is for rev. M S/W or Etch #1 boards and rev. B Etch #2 boards. // (See MEMA.TST for prom revisions.) // (If MC2 Sequencer proms are not rev. E or D, only the final test (Test 4) will fail.) // 2) Run the MEMA test first // 3) Remove test cable #4 from socket "E" to f14(u94/u60), d2(u12/u15), and e4(u43/u44). // 4) Transfer the test clip from location b5(u40/u45) to location g2(u32/u42) // 5) Remove the test clip from location b9(u54/u135) and let it dangle // 6) Install test cable #5 from socket "E" to the locations listed below //************************************************************************************** //DUMP FILES in ifs-2 under : //See MEMA.TST. The dump files listed contain MEMA, MEMB, and MEMC tests //************************************************************************************** //INSTALL THE FOLLOWING TEST CONNECTORS: //CABLE #1: Tester socket "B" to the following // 20-pin clip to c4 (u41/u46) // DisableMC1: c4.1,1 // R_Pipe': c4.2,2 // MC1Pipe.1: c4.5,3 // MC1Pipe.2: c4.6,4 // MC1Pipe.3: c4.9,5 // LoadPipe: c4.12,6 // MC1Ref': c4.15,7 // MC1Store': c4.16,8 // 14-pin clip to e9 (u98/u100) // MC2SetFault: e9.5,9 // LDisableMC1': e9.13,10 // 16-pin clip to h2 (u46/u26) // Disableh2: h2.14,11 // ChkPhase0': h2.12,12 // 20-pin clip to e2 (u35/u70) // Disablee2: e2.1,13 // Odata_Cdat': e2.9,14 // R_H3U': e2.15,15 // R_H3C': e2.16,16 //CABLE #2: Tester socket "C" to the following // 20-pin clip to g14 (u112/u140) // R_H3I': g14.1,1 // 16-pin clip to b3 (u26/u30) // MC1Next.4: b3.3,2 // MC1Next.5: b3.2,3 // 20-pin clip to b6 (u29/u47) // preMC1Next.6: b6.6,4 // preMC1Next.7: b6.9,5 // MC1TestH4Par: b6.12,6 // MC1TestFault: b6.15,7 // MC1SetFault: b6.16,8 // PreloadMC1': b6.19,9 // 20-pin clip to h3 (u30/u73) // DisableMC2: h3.1,10 // LoadSyndrome: h3.5,11 // preLoadOdata': h3.6,12 // MC2Hold': h3.12,13 // MC2WriteCdat: h3.15,14 // MC2NeedsR': h3.16,15 // MC2NeedsRIfSNE0: h3.19,16 //CABLE #3: Tester socket "D" to the following // 20-pin clip to g2 (u32/u42) // MC2Next.4: g2.2,1 // MC2Next.5: g2.5,2 // MC2Next.6: g2.6,3 // preMC2Next.7: g2.9,4 // MC2TestSE: g2.12,5 // MC2TestDE: g2.15,6 // 16-pin clip to c2 (u10/u13) // MC1Next.7': c2.15,7 // 20-pin clip to d4 (u42/u48) // MC1SXport: d4.5,8 // MC1WriteMem: d4.12,9 // MC1StartMC2: d4.15,10 // MC1ClkOutput: d4.16,11 // PreRowAd': d4.19,12 // 20-pin clip labelled b9 (u54/u135) is clipped nowhere (dangles) //CABLE #5: Tester socket "E" to the following // 20-pin clip to b9 (u54/u135) // Disableb9: b9.1,1 // MC1Ftype.0: b9.2,2 // MC1Ftype.1: b9.5,3 // NewPipe: b9.6,4 // MC1Pipe.0: b9.9,5 // Refresh'b: b9.15,6 // PStore12': b9.16,7 // EnInputParChk: b9.19,8 // 16-pin clip to i2 (u45/u10) // MC2Next.0: i2.5,9 // MC2Next.1: i2.6,10 // MC2Next.2: i2.7,11 // MC2Next.3: i2.4,12 // MC2Next.7': i2.15,13 // 16-pin clip to f14 (u94/u60) // Disablef14: f14.14,14 // MC2SE: f14.12,15 // MC2DE: f14.11,16 //************************************************************************************** get "memb.d" static [ mc2 //vector for mc2 prom pattern pass = 0 otime = 0 exectime = 0 ] //Edge pin and test connector signal busses available to this sub-test: //{Idata: Idata.00, Idata.01,Idata.02,Idata.03, Idata.04,Idata.05,Idata.06, Idata.07,Idata.08,Idata.09, Idata.10,Idata.11,Idata.12, Idata.13,Idata.14,Idata.15} //{rbus: R.00, R.01,R.02,R.03, R.04,R.05,R.06, R.07,R.08,R.09, R.10,R.11,R.12, R.13,R.14,R.15} //{StorDin: StorDin.00, StorDin.01,StorDin.02,StorDin.03, StorDin.04,StorDin.05,StorDin.06, StorDin.07,StorDin.08,StorDin.09, StorDin.10,StorDin.11,StorDin.12, StorDin.13,StorDin.14,StorDin.15} //************************************************************************************** //main program for MEMB module test let main() be [ //first, allocate space for the mc2 prom tables and read them from the .mb files (which must be on your disk) let v = vec 256*4 mc2 = v readmc12("D0mem2-D.mb",mc2,1) //now do the tests forever [ pass = pass+1 Test1() Test2() Test3() Test4() ] repeat ] //************************************************************************************** //Routines available for MEMB module tests //Wait-Comparison routine and WCompare(was,sb,testno,drive; numargs na) be [ if was eq sb then return Ws(FORMATN("*nTest : Was = , Should be = ",testno,was,sb)) if na gr 3 then Ws(FORMATN(", drive = ",drive)) while Endofs(keys) do [ ] Gets(keys) Ws("*nRunning...") ] //************************************************************************************** //Clocking routines defined on page 14 and EClock() be //EdgeClockFeed' is normally high [ {EdgeClockFeed'}=0 {EdgeClockFeed'}=1 ] and RClock() be //RamClockFeed' is normally high [ {RamClockFeed'}=0 {RamClockFeed'}=1 ] //************************************************************************************** and SpeakTest(testno) be [ //Calculate the execution time for each test let tv=vec 2 Timer(tv) exectime = tv!1 - otime otime = tv!1 Ws(FORMATN("*nExection Time for this test is msec.",exectime)) //Set up title display Ws("*n") Ws("*n") Ws(FORMATN("*nMEMB TEST (rev. M): Pass , Test ...",pass,testno)) //SET UP MISCELLANEOUS INITIAL CONDITIONS: //Disconnect tester output drivers from the R bus: {rbus}=### //Disconnect tester output drivers from various tri-state sources: //{membus1: Odata_Cdat', R_H3C',R_H3U',StorA0, StorA1,StorA2,StorA3, StorA4,StorA5,StorA6} {membus1}=### //Enable tri-state source e2 and disable souces b9,f14,h2,MC1,MC2: //{membus2: Disablee2,Disableb9,Disablef14, Disableh2,DisableMC1,DisableMC2} {membus2}=#37 //Clear existing busses in general use: {Idata}=0 {StorDin}=0 //Clear combined edge-pin input busses: //{membus3: ALUF.0, ALUF.1,ALUF.2,ALUF.3, CTask.0,CTask.1,CTask.2, CTask.3,StorEcIn.0,StorEcIn.1, StorEcIn.2,StorEcIn.3,StorEcIn.4, StorEcIn.5,StorEcIn.6,StorEcIn.7} {membus3}=0 //Set up individual edge-pin inputs: //{membus4: Cycle0Feed', MC1XferWord,MC2XferWord,MemInst-a, MOBounds,PAbort,QWO, RamClockFeed',ReadSyn',ResetMemErrs'} {membus4}=#107 //Tester-controllable signals to be set to 1 (from disabled tri-state sources): //{membus5: LoadSyndrome, MC1StartMC2,MC2Hold',MC2NeedsR', PreRowAd',R_H3I',R_Pipe'} {membus5}=#177777 //Tester-controllable signals to be set to 0 (from disabled tri-state sources): //{membus6: ChkPhase0',MC1TestH4Par,MC2HoldIfSNE0, MC2NeedsRIfSNE0,PreloadMC1',preLoadOdata'} {membus6}=0 //Generate 8 EClocks to flush the system and initialize EdgeClockFeed'=1: //{Clock: EdgeClockFeed', EdgeClockFeed',EdgeClockFeed',EdgeClockFeed', EdgeClockFeed',EdgeClockFeed',EdgeClockFeed', EdgeClockFeed',EdgeClockFeed',EdgeClockFeed', EdgeClockFeed',EdgeClockFeed',EdgeClockFeed', EdgeClockFeed',EdgeClockFeed',EdgeClockFeed'} {Clock}=#125252 ] //NOTES: The action above results in the following secondary effects //Partial list of gate outputs: // AdvancePipe' =0 (page 18) // ChkSyn[0:7] =0 (pages 2,6) // CorrectThisWord' =1 (page 3) // H4SelIMux =1 (page 18) // LDisableMC1' =1 (page 18) // LoadAd' =0 (page 18) // LoadType' =0 (page 18) // MC2DisableMC1' =1 (page 18) // MC2DisableMC1t' =1 (page 18) // MC2NotReady =0 (page 18) // MC2SynReady =1 (page 18) // MC2WillGetR =0 (page 20) // SNE0 =0 (page 18) //Partial list of flip-flops: // CrctSyn[0:7] _(ChkSyn[0:7] =0) (page 19) // CW2'_CW1'_CW0' _(ChkPhase0' =0) (page 6) // EnColAd' _(EnRowAd' =1) (page 13) // EnRowAd' _(PreRowAd' =1) (page 13) // GateALUParity _0 since Odata_Cdat' =0 (page 10) // h14c_h14b_h14i_h14h _(LoadSyndrome =1) (page 3) // i16 ff's,,b15 ff's _(StorEcIn[0:7] =0) (pages 2,6) // MC2HasR' _1 since MC2WillGetR =0 (page 18) // MC2XferingWord' _1 since MC2XferWord =0 (page 18) // Odata_Cdat' _0 since preLoadOdata' =0 (page 20) // R_H3C' _1 since MC2XferWord =0 (page 20) // R_H3U' _1 since MC2XferWord =0 (page 20) // TypeLoaded' _0 since LoadType' =0 (page 18) // Udat[0:15] _(StorDin[0:15] =0) (pages 4,5)