//**************************************************************************************
//MEMA.TST
//By B. Rosen and M. Thomson  						April 24, 1979
//Main Test Program for UTFP Controller Module
//**************************************************************************************

//NOTES: 1) This test is for rev. M S/W or Etch #1 boards and rev. B Etch #2 boards.
//          (See below for prom revisions.)
//          (If MC1 Sequencer proms are not rev. E, only the final test (Test 10) will fail.)

//       2) STITCH-WELD boards: remove SPLAT from location i1 (Tri-state disable controls)
//       3) If the S51 in location i6(u59/u38) has a pin4 to pin 7 jumper on it,
//          replace the S51 with an un-jumpered one to run the tests. 
//       4) Install test cable #'s 1,2,3,4 in the following sequence: 1-2-3-4. 
//       5) Run MEMA test, then MEMB (shifting clips), then MEMC (shifting clips).
 
//**************************************************************************************

//CURRENT PROM REVISION:			key: StitchWeld(Etch#1/Etch#2)

//	Rev. E: (MC1 Sequencer) a2(u27/u31), a3(u28/u32), a4(u24/u28), b3(u26/u30), b4(u25/u29),
//	        c2(u10/u13), c3(u11/u14), d2(u12/u15), d3(u13/u16), e3(u9/u12)

//	Rev. E: (Fault) i7(u52/u34)

//	Rev. E or D: (MC2 Sequencer) g1(u48/u27), g3(u49/u9), h1(u47/u11), h2(u46/u26), i2(u45/u10)

//	Rev. E or D: (all others) b11(u55/u121), f14(u94/u60)

//**************************************************************************************

//DUMP FILES in ifs-2 under <Thomson>:

//D0MEM-M.DMTESTS contains
//	mema*.tst, mema.d, mema.bp, mema.run, mema*.cm, memaall.cm1, memaall.cm2,
//	memb*.tst, memb.d, memb.bp, memb.run, memb*.cm, memball.cm1, memball.cm2,
//	memc*.tst, memc.d, memc.bp, memc.run, memc*.cm, memcall.cm1, memcall.cm2,
//	readmc12.bcpl, d0mem1-E.mb, d0mem2-D.mb

//The next two dump files permit modification of the tests

//MEMTESTAUX-M.DM contains
//	mema*.br, mema*.bt, mema.bs, mema.syms,
//	memb*.br, memb*.bt, memb.bs, memb.syms,
//	memc*.br, memc*.bt, memc.bs, memc.syms,
//	readmc12.br

//TEST.DM contains
//	BCPL.RUN, BLDR.RUN, TC.RUN, format.br, testfns,br, SYS.BK, STREAMS.D
//	(tester.d and testdefs.d are not used; mema.d, memb.d, memc.d contain their information)

//**************************************************************************************

//INSTALL THE FOLLOWING TEST CONNECTORS:

//CABLE #1: Tester socket "B" to the following
//	20-pin clip to c4 (u41/u46)
//		DisableMC1: c4.1,1
//		R_Pipe': c4.2,2
//		MC1Pipe.1: c4.5,3
//		MC1Pipe.2: c4.6,4
//		MC1Pipe.3: c4.9,5
//		LoadPipe: c4.12,6
//		MC1Ref': c4.15,7
//		MC1Store': c4.16,8
//	14-pin clip to e9 (u98/u100)
//		MC2SetFault: e9.5,9
//		LDisableMC1': e9.13,10
//	16-pin clip to h2 (u46/u26)
//		Disableh2: h2.14,11
//		ChkPhase0': h2.12,12
//	20-pin clip to e2 (u35/u70)
//		Disablee2: e2.1,13
//		Odata_Cdat': e2.9,14
//		R_H3U': e2.15,15
//		R_H3C': e2.16,16

//CABLE #2: Tester socket "C" to the following
//	20-pin clip to g14 (u112/u140)
//		R_H3I': g14.1,1
//	16-pin clip to b3 (u26/u30)
//		MC1Next.4: b3.3,2
//		MC1Next.5: b3.2,3
//	20-pin clip to b6 (u29/u47)
//		preMC1Next.6: b6.6,4
//		preMC1Next.7: b6.9,5
//		MC1TestH4Par: b6.12,6
//		MC1TestFault: b6.15,7
//		MC1SetFault: b6.16,8
//		PreloadMC1': b6.19,9
//	20-pin clip to h3 (u30/u73)
//		DisableMC2: h3.1,10
//		LoadSyndrome: h3.5,11
//		preLoadOdata': h3.6,12
//		MC2Hold': h3.12,13
//		MC2WriteCdat: h3.15,14
//		MC2NeedsR': h3.16,15
//		MC2NeedsRIfSNE0: h3.19,16

//CABLE #3: Tester socket "D" to the following
//	20-pin clip to b5 (u40/u45)
//		GenPhase0: b5.2,1
//		IMux_Cdat: b5.5,2
//		H4_IMux: b5.6,3
//		MapRAS': b5.9,4
//		MapCAS': b5.12,5
//		MapWrite': b5.15,6
//	16-pin clip to c2 (u10/u13)
//		MC1Next.7': c2.15,7
//	20-pin clip to d4 (u42/u48)
//		MC1SXport: d4.5,8
//		MC1WriteMem: d4.12,9
//		MC1StartMC2: d4.15,10
//		MC1ClkOutput: d4.16,11
//		PreRowAd': d4.19,12
//	20-pin clip to b9 (u54/u135)
//		Disableb9: b9.1,13
//		EnInputParChk: b9.19,14
//		MC1Pipe.0: b9.9,15
//		PStore12': b9.16,16

//CABLE #4: Tester socket "E" to the following
//	16-pin clip to f14 (u94/u60)
//		CrctSyn0: f14.5,1
//		CrctSyn1: f14.6,2
//		CrctSyn2: f14.7,3
//		CrctSyn3: f14.4,4
//		CrctSyn4: f14.3,5
//		CrctSyn5: f14.2,6
//		CrctSyn6: f14.1,7
//		CrctSyn7: f14.15,8
//	16-pin clip to d2 (u12/u15)
//		MC1Next.0: d2.5,9
//		MC1Next.1: d2.6,10
//		MC1Next.2: d2.7,11
//		MC1Next.3: d2.4,12
//		MC1Next.6': d2.1,13
//	20-pin clip to e4 (u43/u44)
//		clkMC1': e4.11,14
//		MC1TestQWO: e4.2,15
//		LoadH3I: e4.5,16

//**************************************************************************************
get "mema.d"

static
[
	mc1 //vector for mc1 prom pattern
	pass = 0
	otime = 0
	exectime = 0
]

//Edge pin and test connector signal busses available to this sub-test:

//{Idata: Idata.00,  Idata.01,Idata.02,Idata.03,  Idata.04,Idata.05,Idata.06,  Idata.07,Idata.08,Idata.09,  Idata.10,Idata.11,Idata.12,  Idata.13,Idata.14,Idata.15}

//{rbus: R.00,  R.01,R.02,R.03,  R.04,R.05,R.06,  R.07,R.08,R.09,  R.10,R.11,R.12,  R.13,R.14,R.15}

//{StorDin: StorDin.00,  StorDin.01,StorDin.02,StorDin.03,  StorDin.04,StorDin.05,StorDin.06,  StorDin.07,StorDin.08,StorDin.09,  StorDin.10,StorDin.11,StorDin.12,  StorDin.13,StorDin.14,StorDin.15}

//**************************************************************************************
//main program for MEMA module test

let main() be
[

//first, allocate space for the mc1 prom tables and read them from the .mb files (which must be on your disk)

	let v = vec 256*4
	mc1 = v
	readmc12("D0mem1-E.mb",mc1,3)

	//now do the tests forever

	[
		pass = pass+1

		Test1()
		Test2()
		Test3()
		Test4()
		Test5()
		Test6()
		Test7()
		Test8()
		Test9()
		Test10()

	]  repeat
]

//**************************************************************************************
//Routines available for MEMA module tests

//Wait-Comparison routine
and WCompare(was,sb,testno,drive; numargs na) be
[
	if was eq sb then return

	Ws(FORMATN("*nTest <D>: Was = <B>, Should be = <B>",testno,was,sb))
	if na gr 3 then Ws(FORMATN(", drive = <B>",drive))

	while Endofs(keys) do [  ]  
	Gets(keys)
	Ws("*nRunning...")
]

//**************************************************************************************
//Clocking routines defined on page 14

and EClock() be  //EdgeClockFeed' is normally high
[
	{EdgeClockFeed'}=0
	{EdgeClockFeed'}=1
]

and RClock() be  //RamClockFeed' is normally high
[
	{RamClockFeed'}=0
	{RamClockFeed'}=1
]

//**************************************************************************************
and SpeakTest(testno) be
[

//Calculate the execution time for each test
	let tv=vec 2
	Timer(tv)
	exectime = tv!1 - otime
	otime = tv!1
	Ws(FORMATN("*nExection Time for this test is <D> msec.",exectime))

//Set up title display
	Ws("*n")
	Ws("*n")
	Ws(FORMATN("*nMEMA TEST (rev. M): Pass <D>, Test <D>...",pass,testno))

//SET UP MISCELLANEOUS INITIAL CONDITIONS:

//Disconnect tester output drivers from the R bus:
	{rbus}=###

//Disconnect tester output drivers from various tri-state sources:
//{membus1: Odata_Cdat',  R_H3C',R_H3U',StorA0,  StorA1,StorA2,StorA3,  StorA4,StorA5,StorA6}
	{membus1}=###

//Enable tri-state source e2, and disable souces b9,h2,MC1,MC2:
//{membus2: Disablee2,Disableb9,  Disableh2,DisableMC1,DisableMC2}
	{membus2}=#17

//Clear existing busses in general use:
	{Idata}=0
	{StorDin}=0

//Clear combined edge-pin input busses:
//{membus3: ALUF.0,  ALUF.1,ALUF.2,ALUF.3,  CTask.0,CTask.1,CTask.2,  CTask.3,StorEcIn.0,StorEcIn.1,  StorEcIn.2,StorEcIn.3,StorEcIn.4,  StorEcIn.5,StorEcIn.6,StorEcIn.7}
	{membus3}=0

//Set up individual edge-pin inputs:
//{membus4: Cycle0Feed',  MC1XferWord,MC2XferWord,MemInst-a,  MOBounds,PAbort,QWO,  RamClockFeed',ReadSyn',ResetMemErrs'}
	{membus4}=#107

//Tester-controllable signals to be set to 1 (from disabled tri-state sources):
//{membus5: H4_IMux,LoadH3I,LoadSyndrome,  MC1StartMC2,MC2Hold',MC2NeedsR',  PreRowAd',R_H3I',R_Pipe'}
	{membus5}=#177777

//Tester-controllable signals to be set to 0 (from disabled tri-state sources):
//{membus6: ChkPhase0',  IMux_Cdat,MC1TestH4Par,MC2HoldIfSNE0,  MC2NeedsRIfSNE0,PreloadMC1',preLoadOdata'}
	{membus6}=0

//Generate 8 EClocks to flush the system and initialize EdgeClockFeed'=1:
//{Clock: EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed',  EdgeClockFeed',EdgeClockFeed',EdgeClockFeed'}
	{Clock}=#125252
]

//NOTES: The action above results in the following secondary effects

//Partial list of gate outputs:
//	AdvancePipe' =0 (page 18)
//	ChkSyn[0:7] =0 (pages 2,6)
//	CorrectThisWord' =1 (page 3)
//	H4SelIMux =1 (page 18)
//	LDisableMC1' =1 (page 18)
//	LoadAd' =0 (page 18)
//	LoadType' =0 (page 18)
//	MC2DisableMC1' =1 (page 18)
//	MC2DisableMC1t' =1 (page 18)
//	MC2NotReady =0 (page 18)
//	MC2SynReady =1 (page 18)
//	MC2WillGetR =0 (page 20)
//	SNE0 =0 (page 18)

//Partial list of flip-flops:
//	CrctSyn[0:7] _(ChkSyn[0:7] =0) (page 19)
//	CW2'_CW1'_CW0' _(ChkPhase0' =0) (page 6)
//	EnColAd' _(EnRowAd' =1) (page 13)
//	EnRowAd' _(PreRowAd' =1) (page 13)
//	GateALUParity _0 since Odata_Cdat' =0 (page 10)
//	h14c_h14b_h14i_h14h _(LoadSyndrome =1) (page 3)
//	i16 ff's,,b15 ff's _(StorEcIn[0:7] =0) (pages 2,6)
//	MC2HasR' _1 since MC2WillGetR =0 (page 18)
//	MC2XferingWord' _1 since MC2XferWord =0 (page 18)
//	Odata_Cdat' _0 since preLoadOdata' =0 (page 20)
//	R_H3C' _1 since MC2XferWord =0 (page 20)
//	R_H3U' _1 since MC2XferWord =0 (page 20)
//	TypeLoaded' _0 since LoadType' =0 (page 18)
//	Udat[0:15] _(StorDin[0:15] =0) (pages 4,5)